NEN EN IEC 60749-42 : 2014
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 42: TEMPERATURE AND HUMIDITY STORAGE
Published date
11-11-2014
Publisher
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Defines a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-42:2014 | Identical |
| IEC 60749-42:2014 | Identical |
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