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NEN EN ISO 14880-2 : 2007

Current

Current

The latest, up-to-date edition.

OPTICS AND PHOTONICS - MICROLENS ARRAYS - PART 2: TEST METHODS FOR WAVEFRONT ABERRATIONS

Published date

12-01-2013

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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Apparatus
   5.1 General
   5.2 Standard optical radiation source
   5.3 Standard lens
   5.4 Collimator
   5.5 Beam reduction optical system
   5.6 Aperture stop
6 Test principle
7 Measurement arrangement
   7.1 Measurement arrangement for single microlenses
   7.2 Measurement arrangement for microlens arrays
   7.3 Geometrical alignment of the sample
   7.4 Preparation
8 Procedure
9 Evaluation
10 Accuracy
11 Test report
Annex A (normative) Measurement requirements for test
                    methods for microlenses
Annex B (normative) Microlens test Methods 1 and 2 using
                    Mach-Zehnder interferometer systems
Annex C (normative) Microlens test Methods 3 and 4 using
                    a lateral shearing interferometer system
Annex D (normative) Microlens test Method 5 using a
                    Shack-Hartmann sensor system
Annex E (normative) Microlens array test Method 1 using a
                    Twyman-Green interferometer system
Annex F (normative) Measurement of uniformity of microlens
                    array determined by test Method 2
Bibliography

Provides methods for testing wavefront aberrations for microlenses within microlens arrays. Applicable to microlens arrays with very small lenses formed inside or on one or more surfaces of a common substrate.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Sorry this product is not available in your region.