Name: NEN EN ISO 9220 : 1994
Brand: NEN

METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD

Published date

12-01-2013

Publisher

Netherlands Standards

National foreword
Committees responsible
Method
1. Scope
2. Normative references
3. Definition
4. Principle
5. Instrumentation
6. Factors influencing the measurement results
7. Preparation of cross-sections
8. Calibration of instruments
9. Procedure
10. Measurement uncertainty
11. Expression of results
12. Test report
Annex
A. General guidance on the preparation and
measurement of cross-sections

Uses scanning electron microscope to examine cross sections of metallic coatings to measure thickness.

DocumentType	Standard
PublisherName	Netherlands Standards
Status	Current

Standards	Relationship
I.S. EN ISO 9220:1995	Identical
ISO 9220:1988	Identical
BS EN ISO 9220:1995	Identical
EN ISO 9220 : 1994	Identical
DIN EN ISO 9220:1995-01	Identical
DIN EN ISO 9220 E : 1995	Identical
UNE-EN ISO 9220:1996	Identical
UNI EN ISO 9220 : 1998	Identical
NF EN ISO 9220 : 1995	Identical

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NEN EN ISO 9220 : 1994

METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory