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NEN IEC 62860 : 2013

Current

Current

The latest, up-to-date edition.

TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS

Published date

05-09-2013

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Explains a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
IEC 62860:2013 Identical

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