Name: NEN ISO 16700 : 2016 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION
Brand: Netherlands Standards

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MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION

Published date

12-01-2013

Publisher

Netherlands Standards

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Defines a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material.