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NF EN 60749-40 : 2012

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE

Published date

12-01-2013

DevelopmentNote
Indice de classement: C96-022-40. PR NF EN 60749-40 July 2010. (07/2010)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Current

Standards Relationship
EN 60749-40 : 2011 Identical
IEC 60749-40:2011 Identical

IEC 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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