NF EN 60749-44 : 2016
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
Published date
09-01-2017
Publisher
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| DevelopmentNote |
Indice de classement: C96-022-44. (01/2017)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-44:2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
Summarise
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