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NF EN 60749-6:2017

NF EN 60749-6:2017

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods – Part 6: Storage at high temperature

Available format(s)

Hardcopy

Language(s)

English - French

Published date

01-06-2017

Publisher

Association Francaise de Normalisation

The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.

Committee
TC 47
DocumentType
Test Method
Pages
11
PublisherName
Association Francaise de Normalisation
Status
Current
Supersedes

Standards Relationship
IEC 60749-6:2017 Identical
EN 60749-6:2017 Identical

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Hardcopy - English - French
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