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NF EN 62047-8 : 2011

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 8: STRIP BENDING TEST METHOD FOR TENSILE PROPERTY MEASUREMENT OF THIN FILMS

Published date

12-01-2013

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DevelopmentNote
Indice de classement: C96-050-8. PR NF EN 62047-8 February 2011. (02/2011)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Current

Standards Relationship
IEC 62047-8:2011 Identical
EN 62047-8:2011 Identical

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