Name: NF EN IEC 60749-41:2020 - Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
Brand: Association Francaise de Normalisation

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Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices

Published date

01-09-2020

Publisher

Association Francaise de Normalisation

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This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification.