NF ISO 13067 : 2012
Current
Current
The latest, up-to-date edition.
MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE
Published date
12-01-2013
Publisher
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| DevelopmentNote |
Indice de classement: X21-014. PR NF ISO 13067 September 2010. (10/2010)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
|
| Standards | Relationship |
| ISO 13067:2011 | Identical |
| ISO 16700:2016 | Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 21748:2017 | Guidance for the use of repeatability, reproducibility and trueness estimates in measurement uncertainty evaluation |
| ISO 24173:2009 | Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction |
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