OVE EN IEC 60749-18: 2020 03 01
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose) (( IEC 60749-18:2019) EN IEC 60749-18:2019) (english version)
Hardcopy
English, German
01-03-2020
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-6755-4
|
| Pages |
0
|
| ProductNote |
GERMAN VERSION CONTENT THAT PAGES 26
|
| PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-18:2019 | Identical |
| EN IEC 60749-18:2019 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.