Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-09-2014

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 General
5 Test conditions
6 Test equipment
7 Test setup
8 Test procedure
9 Test report
Annex A (normative) - Calibration of near-field probes
Annex B (informative) - Discrete electric and magnetic
field probes
Annex C (informative) - Combined electric and magnetic
field probe example
Annex D (informative) - Coordinate systems
Bibliography

Gives a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC).

This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. This test procedure is applicable to measurements on an IC mounted on any circuit board that is accessible to the scanning probe. In some cases it is useful to scan not only the IC but also its environment. For comparison of surface scan emissions between different ICs, the standardized test board defined in IEC 61967-1 should be used.

This measurement method provides a mapping of the electric or magnetic near-field emissions over the IC. The resolution of the measurement is determined by the capability of the measurement probe and the precision of the probe-positioning system. This method is intended for use up to 6 GHz. Extending the upper limit of frequency is possible with existing probe technology but is beyond the scope of this specification. Measurements may be carried out in the frequency domain or in the time domain.

Committee	EPL/47
DevelopmentNote	Supersedes DD IEC TS 61967-3. (09/2014)
DocumentType	Standard
Pages	38
PublisherName	British Standards Institution
Status	Current
Supersedes	DD IEC/TS 61967-3:2005 DD IEC TS 61967-3 : DRAFT JAN 2006

Standards	Relationship
IEC TS 61967-3:2014	Identical

IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC TR 61967-1-1:2015	Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC 61967-6:2002+AMD1:2008 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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PD IEC/TS 61967-3:2014

Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method

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