PD ISO/TS 17915:2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Optics and photonics. Measurement method of semiconductor lasers for sensing
Hardcopy , PDF
English
31-07-2013
31-05-2018
Foreword
1 Scope
2 Normative references
3 Optical sensing using semiconductor lasers
4 Measurement method for temperature dependence of wavelength
5 Measurement method for current dependence of wavelength
6 Measurement method of spectral line width
Annex A (informative) - Essential ratings and characteristics
Bibliography
Specifies methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications.
| Committee |
CPW/172
|
| DocumentType |
Standard
|
| Pages |
36
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| ISO/TS 17915:2013 | Identical |
| IEC 62007-1:2015 | Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
| IEC 60747-5-2:1997+AMD1:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics |
| ISO 13695:2004 | Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| ISO 11145:2016 | Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols |
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