PREN 15979 : DRAFT 2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
TESTING OF CERAMIC RAW AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY OES BY DC ARC EXCITATION
12-01-2013
01-01-2011
Foreword
1 Scope
2 Principle
3 Fundamentals
4 Apparatus
5 Reagents
6 Sampling and preparation of test samples
7 Calibration
8 Procedure
9 Calculation
10 Expression of results
11 Precision
12 Test report
Annex A (informative) - Results of inter-laboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible Interferences and their
elimination
Annex D (informative) - Information regarding the evaluation
of the uncertainty of the mean value
Annex E (informative) - Commercial certified reference
materials
Bibliography
Specifies the method for the analysis of mass fractions of the impurities Al, B, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powder- and grain-shaped silicon carbide of ceramic raw and basic materials.
| Committee |
TC 187
|
| DocumentType |
Draft
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN EN 15979 : 2011 | Identical |
| NF EN 15979 : 2011 | Identical |
| 09/30187538 DC : 0 | Identical |
| ISO/IEC Guide 98:1993 | Guide to the expression of uncertainty in measurement (GUM) |
| ISO 5022:1979 | Shaped refractory products — Sampling and acceptance testing |
| ISO 5725-4:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 4: Basic methods for the determination of the trueness of a standard measurement method |
| ISO 5725-2:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method |
| ISO 8656-1:1988 | Refractory products — Sampling of raw materials and unshaped products — Part 1: Sampling scheme |