RIAC VZAP 95 : 1995

SECTION 1
 1.0 INTRODUCTION
 1.1 Background
 1.2 Document Organization
 1.3 Use of this Data
 1.4 Interpretation of Data
 1.5 Conversion of EMP Overstress Test Data to the ESD
     Human Body Model
 1.6 Variability Associated with Conventional Test Methods
 1.7 Summary and Conclusions
SECTION 2 DEVICE SUSCEPTIBILITY PROFILES
SECTION 3 MICROCIRCUIT SUSCEPTIBILITY TEST DATA
SECTION 4 DISCRETE SEMICONDUCTOR SUSCEPTIBILITY TEST DATA
SECTION 5 PASSIVE SUSCEPTIBILITY TEST DATA
SECTION 6 DATA SOURCES
SECTION 7 REFERENCES
APPENDIX A MANUFACTURING INDEX
APPENDIX B FAILURE CRITERIA INDEX
APPENDIX C TEST REMARKS INDEX
APPENDIX D GENERAL REMARKS INDEX
APPENDIX E TEST METHOD INDEX
APPENDIX F PIN COMBINATION INDEX
INDEX 1 SLASH NUMBER INDEX
INDEX 2 PART NUMBER INDEX
TABLES
FIGURES

Includes ESD susceptibility data for 22,000 devices, including microcircuits, discrete semiconductors and resistors.