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SS-EN IEC 60749-10, UTG 2:2022

SS-EN IEC 60749-10, UTG 2:2022

Current

Current

The latest, up-to-date edition.

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Semiconductor components - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly

Published date

19-10-2022

Publisher

Standardiserings-Kommissionen I Sverige

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Summarise this standard

DocumentType
Test Method
PublisherName
Standardiserings-Kommissionen I Sverige
Status
Current

Standards Relationship
IEC 60749-10:2022 Identical
EN IEC 60749-10:2022 Identical
EN 60749-10:2002 Identical

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