UNE-EN IEC 60749-5:2024
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)
Hardcopy , PDF
English
01-03-2024
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 60749-5:2024 | Identical |
| IEC 60749-5:2023 | Identical |
| BS EN IEC 60749-5:2024 | Equivalent |
| DIN EN IEC 60749-5:2024-09 | Equivalent |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.