02/207670 DC : DRAFT JULY 2002
Superseded
Superseded
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IEC 60749-24 ED.1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST
Published date
11-23-2012
Publisher
Superseded date
06-24-2004
Superseded by
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| Committee |
EPL/47
|
| DocumentType |
Draft
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60749-33:2004 | Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave |
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Sorry this product is not available in your region.