04/30125826 DC : DRAFT NOV 2004
Withdrawn
Withdrawn
ISO 18452 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - DETERMINATION OF THICKNESS OF CERAMIC FILMS BY CONTACT-PROBE PROFILOMETER
Published date
11-23-2012
Publisher
Withdrawn date
07-23-2013
Sorry this product is not available in your region.
| Committee |
RPI/13
|
| DocumentType |
Draft
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
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