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09/30190356 DC : 0

Superseded

Superseded

View Superseded by

BS EN 60749-40 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE

Available format(s)

Hardcopy , PDF

Language(s)

English

Superseded date

09-30-2011

Superseded by

BS EN 60749-40:2011

US$28.75
Excluding Tax where applicable
Summarise this standard

1 Scope and object
2 Normative references
3 Terms and definitions
4 Test method and equipment
5 Test procedure
6 Test method
7 Summary
Annex A (Normative) - Drop impact test equipment
        by using test rod
Annex B (Informative) - An example of strain gauge
        attachment procedure

BS EN 60749-40

Committee
EPL/47
DocumentType
Draft
Pages
24
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

⚠

A newer version of this standard is available.

View Current Edition
US$28.75
Excluding Tax where applicable