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Superseded
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BS EN 60749-19:2003+A1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 19: DIE SHEAR STRENGTH
Available format(s)
Hardcopy , PDF
Language(s)
English
Publisher
Superseded date
10-31-2010
Superseded by
US$28.75
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Summarise this standard
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BS EN 60749-19:2003+A1
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
4
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
⚠
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