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09/30208070 DC : 0

Superseded

Superseded

View Superseded by

BS EN 60749-30:2005+A1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING

Available format(s)

Hardcopy , PDF

Language(s)

English

Superseded date

09-30-2011

Superseded by

BS EN 60749-30 : 2005

US$29.42
Excluding Tax where applicable

BS EN 60749-30:2005+A1

Committee
EPL/47
DocumentType
Draft
Pages
7
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

US$29.42
Excluding Tax where applicable