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Superseded
View Superseded by
BS EN 60747-2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 2: RECTIFIER DIODES
Hardcopy , PDF
English
02-06-2018
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
5 Essential ratings and characteristics
6 Measuring and test methods
7 Requirements for type tests, routine tests and
endurance tests; marking of rectifier diodes
BS EN 60747-2
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
41
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
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