14/30299002 DC : 0
Superseded
View Superseded by
BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
Hardcopy , PDF
English
11-30-2016
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Evaluation
7 Summary
Annex A (informative) - Additional requirements
for the applicable procurement specification
Annex B (informative)
Annex C (informative) - Failure Rate Calculation
BS EN 60749-44.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
19
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
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