AS 1099.2EB-1971
Superseded
View Superseded by
Basic environmental testing procedures for electrotechnology Tests - Bump
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
01-01-1971
01-21-2024
The object of this test is to determine the suitability of components and equipments forapplications where they are subjected to prolonged bumping and/or to assess their structural integrity.
| Committee |
EL-026
|
| DocumentType |
Standard
|
| Pages |
4
|
| PublisherName |
Standards Australia
|
| Status |
Superseded
|
| SupersededBy |
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