AS ISO 18118-2006

1 - AS ISO 18118-2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy„Guide to the us
4 - PREFACE
5 - CONTENTS
6 - INTRODUCTION
7 - 1 Scope
7 - 2 Normative references
7 - 3 Terms and definitions
8 - 4 Symbols and abbreviated terms
9 - 5 General information
10 - 6 Measurement conditions
10 - 6.1 General
10 - 6.2 Excitation source
10 - 6.3 Energy resolution
10 - 6.4 Energy step and scan rate
10 - 6.5 Signal intensity
10 - 6.6 Gain and time constant (for AES instruments with analogue detection systems)
10 - 6.7 Modulation to generate a derivative spectrum
11 - 7 Data-analysis procedures
11 - 8 Intensity-energy response function
11 - 9 Determination of chemical composition using relative sensitivity factors
11 - 9.1 Calculation of chemical composition
12 - 9.2 Uncertainties in calculated compositions
13 - Annex A (normative) Equations for relative sensitivity factors
23 - Annex B (informative) Information on uncertainty of the analytical results
26 - Bibliography

Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.

First published as AS ISO 18118-2006.