BIS IS 15444-1 : 2012(R2016)
Current
Current
RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE ASSEMBLIES MANUFACTURED IN LOTS
Published date
01-12-2013
Publisher
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Defines describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
| Committee |
LITD 2
|
| DocumentType |
Standard
|
| PublisherName |
Bureau of Indian Standards
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61163-1:2006 | Identical |
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