BS 2011-2.1Eb:1977
Superseded
View Superseded by
Test Eb. BumpEnvironmental testing. Tests
Hardcopy
English
06-29-1984
10-30-1987
To determine the suitability of components and equipment for applications where they are subjected to prolonged bumping, and/or to assess their structural integrity. Primarily intended for unpackaged specimens and for items in their transport case when the latter may be considered as part of the specimen itself.
| Committee |
GEL/104
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60068-2-29:1987 | Identical |
| IEC 60068-2-29:1968 | Identical |
| BS QC 300000:1983 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Generic specification |
| BS 5772-4:1979 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods Dynamic stress tests |
| BS 6201-1:1982 | Fixed capacitors for use in electronic equipment Methods of test |
| BS 5786-1:1979 | Variable capacitors Methods of test |
| BS CECC 42200:1988 | Harmonized system of quality assessment for electronic components. Sectional specification: surge suppression varistors |
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