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BS 6493-2.1:1985

Superseded

Superseded

View Superseded by

Semiconductor devices. Integrated circuits General

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-06-2002

Superseded date

07-30-2002

Superseded by

BS IEC 60748-1:2002

US$391.00
Excluding Tax where applicable
Summarise this standard

National foreword
Committees responsible
Chapter I: Scope and presentation of IEC Publication 748
1 Scope
2 Presentation
Chapter II: Purpose & presentation of Publication 748-1
1 General
2 Purpose
3 Presentation
Chapter III: Purpose, presentation and requirements on
the contents of publications 748-2, 748-3, etc. (under
consideration)
Chapter IV: Terminology, general
1 General terms
2 Types of devices
3 Clamping characteristics of integrated circuits
4 Technological concepts
5 Concepts for particular device types of film
   integrated circuits and hybrid film integrated
   circuits
Chapter V: Letter symbols, general
1 Basic letters
2 Subscripts for digital integrated circuits
   2.1 Voltages and currents
   2.2 Switching times
3 Subscripts for analogue integrated circuits
Chapter VI: Essential ratings and characteristics,
general
1 Introduction
2 Standard format for the presentation of published
   data and method for describing essential ratings
   and characteristics and function specification of
   integrated circuits
   2.1 Standard format for the presentation of published
        data
   2.2 Method for describing essential ratings and
        characteristics and function specification of
        integrated circuits
3 Basic "rating" definitions
4 Definitions of cooling conditions
5 List of preferred temperatures
6 List of preferred voltages
   6.1 List of preferred nominal voltages for recommended
        operating conditions
   6.2 Tolerances on voltages
7 Mechanical ratings, characteristics and other data
8 Production spread and compliance
9 Printed wiring and printed circuits
Chapter VII: Measuring methods, general
1 Basic requirements
   1.1 Introduction
   1.2 General precautions
2 Specific requirements on the measuring methods
3 Numbering system for measuring methods
   3.1 Numbering principle
   3.2 Numbering list of measuring methods for integrated
        circuits
   3.3 Application matrices
   3.4 Updating
Chapter VIII: Acceptance and reliability of integrated
circuits
Section One - General
Section Two - General principles
(under consideration)
Section Three - Electrical endurance tests
1 Purpose and presentation
2 General requirements
   2.1 Conditions for electrical tests
   2.2 Duration of test
   2.3 Failure-defining characteristics and measurements
   2.4 Failure criteria
   2.5 Precautions
3 Specific requirements. General
   3.1 List of endurance tests
   3.2 Conditions for endurance tests
   3.3 Failure-defining characteristics and failure
        criteria for acceptance after endurance tests
   3.4 Failure-defining characteristics and failure
        criteria for reliability (under consideration)
   3.5 Procedure in case of a testing error
Chapter IX: Electrostatic sensitive devices
(see Publication 747-1, Chapter IX)

General recommendations for integrated circuits.

Committee
EPL/47
DevelopmentNote
Also numbered as IEC 60748-1 Supersedes BS 3363(1980), BS 3363:SUPP1(1981), BS 3363:SUPP2(1981), 87/23034 DC and 87/32332 DC (08/2002)
DocumentType
Standard
Pages
38
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 60748-1:1984 Identical

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US$391.00
Excluding Tax where applicable