BS CECC 20000:1983
Superseded
View Superseded by
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
Hardcopy , PDF
English
06-30-1983
09-15-1996
Prescribes quality assessment procedures and test and measurement conditions applicable to semiconductor optoelectronic and liquid crystal devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. Superseded by BS EN 120000 but remains current. (08/2005)
|
| DocumentType |
Standard
|
| Pages |
100
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CECC 20000 : 82 AMD 3 | Identical |
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