Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-15-1985

Publisher

British Standards Institution

Provides general conditions, ratings (limiting values), characteristics, test conditions and inspection requirements for a range of film and hybrid integrated circuits.

Committee	EPL/47
DevelopmentNote	Inactive for the new design. (01/2006)
DocumentType	Standard
Pages	16
PublisherName	British Standards Institution
Status	Current

Standards	Relationship
CECC 63101 : 84 AMD 1	Identical

BS CECC 63100:1985	Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
BS 9300:1969	Specification for semiconductor devices of assessed quality: generic data and methods of test
BS 9000-2(1996) : 1996	GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
BS 6001(1972) : AMD 5054	SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION