BS CECC 75101:1984
Current
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application
Hardcopy , PDF
English
11-15-1984
Describes the specification for harmonised system of quality assessment for electronic components. The object is to facilitate international trade by standardisation of specifications of electronic components. Two-part and edge socket connectors for printed board applications.
| Committee |
EPL/48
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Standards | Relationship |
| CECC 75101 : 1984 | Identical |
| BS 5772-8:1985 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods Connector tests (mechanical) and mechanical tests on contacts and terminations |
| BS 9000(1967) : LATEST | |
| BS CECC 75100:1984 | Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application |
| BS 5772-4:1979 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods Dynamic stress tests |
| BS 5772-8:SUPP1(1981) : LATEST | |
| BS 5772-6:SUPP1(1981) : 1981 | BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT - CLIMATIC TESTS AND SOLDERING TESTS TEST 11B |
| BS 5772-2:SUPP1(1981) : 1981 | BASIC TESTING PROCEDURES & MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT - GENERAL EXAMINATION, ELECTRICAL CONTINUITY AND CONTACT RESISTANCE TESTS, INSULATION TESTS AND VOLTAGE STRESS TESTS - TEST 4C |
| BS 5772-2:1979 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods General examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests |
| BS 5772-8:SUPP2(1982) : LATEST |
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