BS EN 140000:1995
Superseded
View Superseded by
Harmonized system of quality assessment for electronic components. Generic specification: fixed resistors
Hardcopy , PDF
English
03-15-1995
04-01-2004
Cooperating organizations
National foreword
Foreword
Section one. Scope
1. Scope
Section two. General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
2.5 ESD sensitivity
Section three. Quality assessment procedures
3. Quality assessment procedures
3.1 General
3.2 Primary stage of manufacture
3.3 Subcontracting
3.4 Structurally similar components
3.5 Qualification approval procedures
3.6 Capability approval procedures
3.7 Rework and repair work
3.8 Release for delivery
3.9 Certified test records
3.10 Delayed delivery
3.11 Alternative test methods
3.12 Assessed process average procedures
3.13 Manufacture outside the geographical limits of CECC
supervising inspectorates
Section four. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Insulation resistance
4.7 Voltage proof
4.8 Variation of resistance with temperature
4.9 Reactance
4.10 Non-linear properties
4.11 Voltage coefficient
4.12 Noise
4.13 Overload
4.14 Temperature rise
4.15 Robustness of the resistor body
4.16 Robustness of terminations
4.17 Solderability
4.18 Resistance to soldering heat
4.19 Rapid change of temperature
4.20 Bump
4.21 Shock
4.22 Vibration
4.23 Climatic sequence
4.24 Damp heat, steady state
4.25 Endurance
4.26 Accidental overload test (for lower power
non-wirewound resistors only)
4.27 Single-pulse high-voltage overload test
4.28 Periodic pulse high-voltage overload test
4.29 Component solvent resistance
4.30 Solvent resistance of marking
4.31 Shear test and substrate bending test (for surface
mounting resistors only)
4.32 Corrosion
4.33 Flammability
4.34 Seal test (Hermetically sealed resistors only)
Annexes
A. Example of a certified test record (RCE)
B. Internal visual examination of fixed resistors
C. External visual examination of fixed resistors
with enhanced assessment of quality
D. Radiographic inspection of fixed resistors
E. Blank detail specifications
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references
Relates to fixed discrete resistors with the exception of those whose prime usage requires that resistance is temperature or voltage dependent.
| Committee |
W/-
|
| DevelopmentNote |
Supersedes BS CECC 40000(1980) and 92/30898 DC. (04/2004)
|
| DocumentType |
Standard
|
| Pages |
60
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| I.S. EN 140000:1994 | Identical |
| DIN EN 140000:1994-10 | Identical |
| NEN EN 140000 : 1997 | Identical |
| EN 140000 : 1993 | Identical |