BS EN 153000:1998
Current
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
Hardcopy , PDF
English
07-15-1998
Applies to rectifier diodes, transistors, thyristors and their derivatives. The requirements also cover encapsulated assemblies but not to stacks or assemblies made with these encapsulated components.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 95/203864 DC (08/2004)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| I.S. EN 153000:1998 | Identical |
| EN 153000:1998 | Identical |
| DIN EN 153000:1999-01 | Identical |
| NEN EN 153000 : 1998 | Identical |
| UNE-EN 153000:1998 | Equivalent |
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| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| CECC 00111 : 80 AMD 3 | CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY |
| IEC 60148:1969 | Letter symbols for semiconductor devices and integrated microcircuits |
| IEC 60747-6:2016 | Semiconductor devices - Part 6: Discrete devices - Thyristors |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| CECC 00007 : 1978 | BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES |
| IEC 60747-2:2016 | Semiconductor devices - Part 2: Discrete devices - Rectifier diodes |
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