BS EN 60539-1:2016

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General items
5 Test and measurement procedures
Annex A (normative) - Interpretation of sampling plans
        and procedures as described in IEC 60410:1973
        for use within quality assessment systems
Annex B (normative) - Rules for the preparation of detail
        specifications for directly heated thermistors for
        electronic equipment for use within quality
        assessment systems
Annex C (informative) - Typical examples of mountings for
        measurements of directly heated thermistors
Annex D (informative) - Reference to IEC 60539-1:2008
Annex Q (normative) - Quality assessment procedures
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding
         European publications

Pertains to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.

This part of IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties.

It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.