BS EN 60749-26:2006
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Hardcopy , PDF
English
09-29-2006
04-30-2016
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.
| Standards | Relationship |
| EN 60749-26:2006 | Equivalent |
| I.S. EN 60749-26:2006 | Equivalent |
| IEC 60749-26:2006 | Identical |
| IEC 60893-3-2:2003/AMD1:2011 | Identical |
| UNE-EN 60749-26:2006 | Equivalent |
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