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BS EN 60749-36:2003

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

06-19-2003

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Committee
EPL/47
DevelopmentNote
Supersedes 01/208601 DC (07/2003) Supersedes BS EN 60749. (09/2005)
DocumentType
Standard
Pages
8
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
NBN EN 60749-36 : 2004 Identical
EN 60749-36:2003 Identical
UNE-EN 60749-36:2004 Identical
SN EN 60749-36 : 2003 Identical
I.S. EN 60749-36:2003 Identical
NF EN 60749-36 : 2003 Identical
IEC 60749-36:2003 Identical
DIN EN 60749-36:2003-12 Identical

EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state

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