BS EN 61280-2-8:2003

1 Scope
2 Definitions and abbreviated terms
  2.1 Definitions
  2.2 Abbreviations
3 Measurement of low bit-error ratios
  3.1 General considerations
  3.2 Background to Q-factor
4 Variable decision threshold method
  4.1 Overview
  4.2 Apparatus
  4.3 Sampling and specimens
  4.4 Procedure
  4.5 Calculations and interpretation of results
  4.6 Test documentation
  4.7 Specification information
5 Variable optical threshold method
  5.1 Overview
  5.2 Apparatus
  5.3 Items under test
  5.4 Procedure for basic optical link
  5.5 Procedure for self-contained system
  5.6 Evaluation of results
Annex A (normative) Calculation of error bound in the value of Q
Annex B (informative) Sinusoidal interference method
Bibliography

Provides two main methods for the determination of low BER values by making accelerated measurements.

IEC 61280-2-8:2003 specifies two main methods for the determination of low BER values by making accelerated measurements. These include the variable decision threshold method (Clause 4) and the variable optical threshold method (Clause 5). In addition, a third method, the sinusoidal interference method, is described in Annex B. Key Words: BER values, variable decision threshold method, variable optical threshold method, sinusoidal interference method