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BS EN 61340-3-2:2007

BS EN 61340-3-2:2007

Current

Current

The latest, up-to-date edition.

Electrostatics Methods for simulation of electrostatic effects. Machine model (MM) electrostatic discharge test waveforms

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-30-2007

Publisher

British Standards Institution

Foreword
1 Scope
2 Terms and definitions
3 Equipment
4 MM current waveform requirements
5 Evaluation of ESD robustness of the UUT
6 Test procedure
7 Failure criteria
8 MM ESD withstand classification
Bibliography

Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms.

Describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify these waveforms. This standard covers MM ESD waveforms for use in general test methods and for application to materials or objects, electronic components and other items for ESD withstand test or performance evaluation purposes. The specific application of these MM ESD waveforms to non-powered semiconductor devices is covered in IEC 60749-27. The major change of this document is that it no longer contains the application to semiconductor devices.

Committee
GEL/101
DevelopmentNote
Supersedes 98/261861 DC (07/2002) Supersedes 05/30127809 DC. (04/2007)
DocumentType
Standard
Pages
12
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
UNE-EN 61340-3-2:2007 Identical
EN 61340-3-2:2007 Identical
I.S. EN 61340-3-2:2007 Identical
IEC 61340-3-2:2006 Identical
NF EN 61340-3-2 : 2007 Identical
DIN EN 61340-3-2 : 2007 Identical

IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
EN 60749-27:2006/A1:2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

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Hardcopy - English
PDF - English
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