BS EN 62220-1-3:2008

INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
  4.1 Operating conditions
  4.2 X-RAY EQUIPMENT
  4.3 RADIATION QUALITY
  4.4 TEST DEVICE
  4.5 Geometry
  4.6 IRRADIATION conditions
      4.6.1 General conditions
      4.6.2 AIR KERMA measurement
      4.6.3 LAG EFFECTS
      4.6.4 IRRADIATION to obtain the CONVERSION
            FUNCTION
      4.6.5 IRRADIATION for determination of the NOISE
            POWER SPECTRUM and LAG EFFECTS
      4.6.6 IRRADIATION with TEST DEVICE in the
            RADIATION BEAM
      4.6.7 Overview of all necessary IRRADIATIONS
5 Corrections of RAW DATA
6 Determination of the DETECTIVE QUANTUM EFFICIENCY
  6.1 Definition and formula of DQE(u,v)
  6.2 Parameters to be used for evaluation
  6.3 Determination of different parameters from the images
      6.3.1 Linearization of data
      6.3.2 The LAG EFFECTS corrected NOISE POWER
            SPECTRUM (NPS)
      6.3.3 Determination of the MODULATION TRANSFER
            FUNCTION (MTF)
7 Format of conformance statement
8 Accuracy
Annex A (informative) - Determination of LAG EFFECTS
Annex B (informative) - Calculation of the input NOISE
        POWER SPECTRUM
Bibliography
Index of defined terms
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications
Annex ZZ (informative) - Coverage of Essential Requirements
         of EC Directives

Describes the method for the determination of the DETECTIVE QUANTUM EFFICIENCY (DQE) of DIGITAL X-RAY IMAGING DEVICES as a function of AIR KERMA and of SPATIAL FREQUENCY for the working conditions in the range of the medical application as specified by the MANUFACTURER.

IEC 62220-1-3:2008 specifies the method for the determination of the detective quantum efficiency (DQE) of digital X-ray imaging devices as a function of air kerma and of spatial frequency for the working conditions in the range of the medical application as specified by the manufacturer. The intended users of this part of IEC 62220 are manufacturers and well equipped test laboratories. This Part 1-3 is restricted to digital X-ray imaging devices that are used for dynamic imaging such as, but not exclusively, direct and indirect flat panel-detector based systems. It is not recommended to use this part of IEC 62220 for digital X-ray image intensifier-based systems.