BS EN 62415:2010
Current
Semiconductor devices. Constant current electromigration test
Hardcopy , PDF
English
07-31-2010
1 Scope
2 Symbols, terms and definitions
3 Background
4 Sample size
5 Test structures
6 Test conditions
7 Failure criteria
8 Data analysis
Bibliography
Defines a method for conventional constant current electromigration testing of metal lines, via string and contacts.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
| Standards | Relationship |
| IEC 62415:2010 | Identical |
| EN 62415:2010 | Identical |
| I.S. EN 62415:2010 | Equivalent |
| DIN EN 62415:2010-12 | Equivalent |
| UNE-EN 62415:2010 | Equivalent |
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