BS EN IEC 60749-12:2018
Current
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Hardcopy , PDF
English
04-18-2018
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS EN 60749-12. (06/2018)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of IEC60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.
| Standards | Relationship |
| EN IEC 60749-12:2018 | Identical |
| IEC 60749-12:2017 | Identical |
| DIN EN IEC 60749-12:2018-07 | Equivalent |
| IEC 60749-12:2002 | Identical |
| I.S. EN IEC 60749-12:2018 | Equivalent |
| UNE-EN IEC 60749-12:2018 | Equivalent |
| EN IEC 60749-12:2018 | Equivalent |
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