Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)

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Hardcopy , PDF

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English

Published date

06-10-2019

Publisher

British Standards Institution

This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.

IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.

Committee	EPL/47
DocumentType	Standard
ISBN	9780539002348
Pages	24
ProductNote	THIS STANDARD ALSO REFERS TO ASTM F 1892.
PublisherName	British Standards Institution
Status	Current
Supersedes	BS EN 60749-18:2003

Standards	Relationship
EN IEC 60749-18 : 2019	Identical
IEC 60749-18:2019	Identical

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BS EN IEC 60749-18:2019

Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)

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