BS IEC 60747-4.2 : 2000
Withdrawn
Withdrawn
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2000
Publisher
Withdrawn date
04-25-2012
US$197.09
Excluding Tax where applicable
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 97/204800 DC (05/2005) Also numbered as BS QC750116(2000). (07/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-4-2:2000 | Identical |
| IEC 60747-4:2007+AMD1:2017 CSV | Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60748-11:1990 | Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 60748-1:2002 | Semiconductor devices - Integrated circuits - Part 1: General |
Summarise
US$197.09
Excluding Tax where applicable
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