BS IEC 60747-5-4:2006
Superseded
View Superseded by
Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers
Hardcopy , PDF
English
06-30-2006
06-20-2022
1 Scope
2 Normative references
3 General
3.1 Physical concepts
3.3 General terms
3.4 Terms related to ratings and characteristics
4 Essential rating and characteristics
4.1 Type
4.2 Semiconductor
4.3 Details of outline drawing and encapsulation
4.4 Limiting values (absolute maximum ratings)
4.5 Electrical and optical characteristics
4.6 Supplementary information - Temperature dependence of
wavelength
5 Measurement methods
5.1 Power measurement
5.2 Output power stability
5.3 Time domain profile
5.4 Lifetime
5.5 Optical characteristics of the laser beam
Annex A (informative) Reference list of technical terms and
definitions related to spatial profile
and spectral characteristics
Annex B (informative) Reference list of measurement methods
related to spatial profile and spectral
characteristics
Annex C (informative) Reference list of technical terms and
definitions, and measurement methods,
related to power measurement and lifetime
Bibliography
Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
| Standards | Relationship |
| IEC 60747-5-4:2006 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.