BS IEC 60748-11:2000
Current
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
Hardcopy , PDF
English
07-31-2011
Committees responsible
National foreword
1 Scope
2 General
3 Subcontracting
4 Primary stage of manufacture
5 Quality assessment procedures
6 Structural similarity procedures
7 Groups and sub-groups
8 Screening
9 Sampling requirements
10 Terminal identification
11 Additional information
12 Test and measurement procedures
Appendix A - Guidance and format for drafting blank
detail specifications
Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits.
| Committee |
EPL/47
|
| DevelopmentNote |
Renumbers and supersedes BS QC790100(1991). 2000 version incorporates amendment 10586 to BS QC790100(1991). (04/2000) Supersedes 97/230052 DC. (09/2007) Together with BS IEC 60747-10, it supersedes BS 9450(1998). (08/2011)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This sectional specification applies to encapsulated semiconductor integrated circuits, including multi-chip integrated circuits, but excluding hybrid circuits.
| Standards | Relationship |
| IEC 60748-11:1990 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.