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BS IEC 63011-2:2018

Current

Current

The latest, up-to-date edition.

Integrated circuits. Three dimensional integrated circuits Alignment of stacked dies having fine pitch interconnect

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-24-2019

IEC63011-2:2018provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.

Committee
EPL/47
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 63011-2:2018 Identical

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