BS QC 750001:1986
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
Hardcopy , PDF
English
11-15-1986
04-25-2012
NO CONTENTS SECTION
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semi conductor devices and specifies quality assessment, test and measurement procedures. Deals with signal diodes, switching diodes and controlled avalanche diodes.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-3-1 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
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| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 6493-1.3:1986 | Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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