BS QC 750005:1987
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
Hardcopy , PDF
English
09-15-1987
04-25-2012
NO CONTENTS SECTION
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semi conductor devices and specifies quality assessment, test and measurement procedures. Deals with voltage regulator diodes, voltage reference diodes and precision reference diodes.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-3-2 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| BS QC 750110:1990 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 6493-1.3:1986 | Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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